Messages in this thread Patch in this message | | | From | Marek Szyprowski <> | Subject | [PATCH 1/2] pwm: samsung: Fix broken resume after putting per-channel data into driver data | Date | Thu, 9 Nov 2023 11:47:47 +0100 |
| |
PWMF_EXPORTED is misleadingly used as a bit numer in the pwm->flags, not as a flag value, so the proper test for it must use test_bit() helper. This fixes broken resume after putting per-channel data into driver data.
Fixes: e3fe982b2e4e ("pwm: samsung: Put per-channel data into driver data") Signed-off-by: Marek Szyprowski <m.szyprowski@samsung.com> --- drivers/pwm/pwm-samsung.c | 2 +- 1 file changed, 1 insertion(+), 1 deletion(-)
diff --git a/drivers/pwm/pwm-samsung.c b/drivers/pwm/pwm-samsung.c index 568491ed6829..69d9f4577b34 100644 --- a/drivers/pwm/pwm-samsung.c +++ b/drivers/pwm/pwm-samsung.c @@ -631,7 +631,7 @@ static int pwm_samsung_resume(struct device *dev) struct pwm_device *pwm = &chip->pwms[i]; struct samsung_pwm_channel *chan = &our_chip->channel[i]; - if (!(pwm->flags & PWMF_REQUESTED)) + if (!test_bit(PWMF_REQUESTED, &pwm->flags)) continue; if (our_chip->variant.output_mask & BIT(i)) -- 2.34.1
| |