Messages in this thread | | | From | Ben Shelton <> | Subject | [PATCH 0/3] mtd: use ONFI bad blocks per LUN to calculate UBIFS bad PEB limit | Date | Mon, 11 May 2015 10:19:53 -0500 |
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For ONFI-compliant NAND devices, the ONFI parameters report the maximum number of bad blocks per LUN that will be encountered over the lifetime of the device, so we can use that information to get a more accurate (and smaller) value for the UBIFS bad PEB limit.
These patches are ordered in terms of their dependencies, but ideally, all 3 would need to be applied for this to work as intended.
Jeff Westfahl (3): mtd: introduce function max_bad_blocks mtd: nand: implement 'max_bad_blocks' mtd function mtd: ubi: use 'max_bad_blocks' to compute bad_peb_limit
drivers/mtd/mtdpart.c | 12 ++++++++++++ drivers/mtd/nand/nand_base.c | 35 +++++++++++++++++++++++++++++++++++ drivers/mtd/ubi/build.c | 10 ++++++++++ include/linux/mtd/mtd.h | 1 + 4 files changed, 58 insertions(+)
-- 2.4.0
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