Messages in this thread | | | From | Kyle Moffett <> | Subject | [2.6.15] PDC202XX error: "no DRQ after issuing MULTWRITE_EXT" | Date | Sun, 12 Mar 2006 01:30:46 -0500 |
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I upgraded my kernel from a Debian linux-image-2.6.12-1-powerpc kernel (with a patch to the powermac IDE driver to prevent deactivating empty interfaces) to a Debian linux-image-2.6.15-powerpc kernel and started getting the following message in the logs. It refers to a Samsung PATA drive attached to the secondary channel on a Sonnet Tempo ATA/100. The card is a rebranded FirmTek UltraTek/100 which is actually a PDC20268 with a Mac-bootable firmware ROM.
hda: status timeout: status=0xd0 { Busy } PDC202XX: Secondary channel reset. hdi: no DRQ after issuing MULTWRITE_EXT ide4: reset: success
The message seems to occur randomly, and does not coincide with the routine SMART testing of the drive (triggered by smartd) or the routing SMART status monitoring run from a custom Perl curses application. The output of "smartctl -a /dev/hdi" is attached. You will notice that all diagnostics appear to be perfectly OK, and repeated checks of the RAID for internal consistency all indicate correctness, so it's not an urgent data-corruption issue, but I believe it merits further investigation.
Thanks for your time!
Cheers, Kyle Moffett
smartctl version 5.34 [powerpc-unknown-linux-gnu] Copyright (C) 2002-5 Bruce Allen Home page is http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION === Device Model: SAMSUNG SP0822N Serial Number: S06QJ10Y946116 Firmware Version: WA100-32 User Capacity: 80,060,424,192 bytes Device is: In smartctl database [for details use: -P show] ATA Version is: 6 ATA Standard is: ATA/ATAPI-6 T13 1410D revision 1 Local Time is: Sun Mar 12 00:56:28 2006 EST SMART support is: Available - device has SMART capability. SMART support is: Enabled
=== STARRT OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED
General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self- test has ever been run. Total time to complete Offline data collection: (1980) seconds Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off suppport. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. No General Purpose Logging support. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 33) minutes.
SMART Attributes Data Structure revision number: 17 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000f 100 099 051 Pre-fail Always - 0 3 Spin_Up_Time 0x0007 252 252 011 Pre-fail Always - 0 4 Start_Stop_Count 0x0032 252 252 000 Old_age Always - 0 5 Reallocated_Sector_Ct 0x0033 252 252 011 Pre-fail Always - 0 7 Seek_Error_Rate 0x000f 252 252 051 Pre-fail Always - 0 8 Seek_Time_Performance 0x0025 092 092 015 Pre-fail Offline - 3730 9 Power_On_Half_Minutes 0x0032 099 099 000 Old_age Always - 29h+25m 10 Spin_Retry_Count 0x0033 252 252 051 Pre-fail Always - 0 11 Calibration_Retry_Count 0x0012 252 252 000 Old_age Always - 0 12 Power_Cycle_Count 0x0032 252 252 000 Old_age Always - 0 190 Unknown_Attribute 0x0022 142 133 000 Old_age Always - 37 194 Temperature_Celsius 0x0022 145 133 000 Old_age Always - 36 195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always - 0 196 Reallocated_Event_Count 0x0032 252 252 000 Old_age Always - 0 197 Current_Pending_Sector 0x0012 252 252 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0030 252 252 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x003e 199 199 000 Old_age Always - 173 200 Multi_Zone_Error_Rate 0x000a 100 100 000 Old_age Always - 0 201 Soft_Read_Error_Rate 0x000a 100 100 000 Old_age Always - 0
Warning! SMART ATA Error Log Structure error: invalid SMART checksum. SMART Error Log Version: 1 No Errors Logged
SMART Self-test log structure revision number 0 Warning: ATA Specification requires self-test log structure revision number = 1 Num Test_Description Status Remaining LifeTime (hours) LBA_of_first_error # 1 Short offline Completed without error 00% 3511 - # 2 Short offline Completed without error 00% 3487 - # 3 Short offline Completed without error 00% 3463 - # 4 Short offline Completed without error 00% 3439 - # 5 Short offline Completed without error 00% 3415 - # 6 Short offline Completed without error 00% 3391 - # 7 Extended offline Completed without error 00% 3367 - # 8 Short offline Completed without error 00% 3343 - # 9 Short offline Completed without error 00% 3319 - #10 Short offline Completed without error 00% 3295 - #11 Short offline Completed without error 00% 3271 - #12 Short offline Completed without error 00% 3247 - #13 Short offline Completed without error 00% 3223 - #14 Extended offline Completed without error 00% 3200 - #15 Short offline Completed without error 00% 3175 - #16 Short offline Completed without error 00% 3151 - #17 Short offline Completed without error 00% 3127 - #18 Short offline Completed without error 00% 3103 - #19 Short offline Completed without error 00% 3080 - #20 Short offline Completed without error 00% 3056 - #21 Extended offline Completed without error 00% 3032 -
SMART Selective Self-Test Log Data Structure Revision Number (0) should be 1 SMART Selective self-test log data structure revision number 0 Warning: ATA Specification requires selective self-test log data structure revision number = 1 SPAN MIN_LBA MAX_LBA CURRENT_TESET_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 281479271677952 0 Not_testing 4 0 281479271767952 Not_testing 5 604800 4 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.
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