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Subject[PATCH v8 3/3] Documentation: ABI: testing: rtq6056: Update ABI docs
Date
From: ChiYuan Huang <cy_huang@richtek.com>

Add documentation for the usage of voltage channel integration time.

Signed-off-by: ChiYuan Huang <cy_huang@richtek.com>
---
Since v8
- Update IIO ABI about sampling frequency for power/current/voltage channel.

---
Documentation/ABI/testing/sysfs-bus-iio | 11 +++++++++++
1 file changed, 11 insertions(+)

diff --git a/Documentation/ABI/testing/sysfs-bus-iio b/Documentation/ABI/testing/sysfs-bus-iio
index d4ccc68..17855f7 100644
--- a/Documentation/ABI/testing/sysfs-bus-iio
+++ b/Documentation/ABI/testing/sysfs-bus-iio
@@ -2030,3 +2030,14 @@ Description:
Available range for the forced calibration value, expressed as:

- a range specified as "[min step max]"
+
+What: /sys/bus/iio/devices/iio:deviceX/in_voltageX_sampling_frequency
+What: /sys/bus/iio/devices/iio:deviceX/in_powerY_sampling_frequency
+What: /sys/bus/iio/devices/iio:deviceX/in_currentZ_sampling_frequency
+KernelVersion: 5.20
+Contact: linux-iio@vger.kernel.org
+Description:
+ Some devices have separate controls of sampling frequency for
+ individual channels. If multiple channels are enabled in a scan,
+ then the sampling_frequency of the scan may be computed from the
+ per channel sampling frequencies.
--
2.7.4
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