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Subject[PATCH v6 3/3] Documentation: ABI: testing: rtq6056: Update ABI docs
Date
From: ChiYuan Huang <cy_huang@richtek.com>

Add documentation for the usage of voltage channel integration time.

Signed-off-by: ChiYuan Huang <cy_huang@richtek.com>
---
Documentation/ABI/testing/sysfs-bus-iio | 10 ++++++++++
1 file changed, 10 insertions(+)

diff --git a/Documentation/ABI/testing/sysfs-bus-iio b/Documentation/ABI/testing/sysfs-bus-iio
index d4ccc68..1f7d327 100644
--- a/Documentation/ABI/testing/sysfs-bus-iio
+++ b/Documentation/ABI/testing/sysfs-bus-iio
@@ -2030,3 +2030,13 @@ Description:
Available range for the forced calibration value, expressed as:

- a range specified as "[min step max]"
+
+What: /sys/bus/iio/devices/iio:deviceX/in_voltageY_integration_time
+KernelVersion: 5.20
+Contact: linux-iio@vger.kernel.org
+Description:
+ For voltage sensing hardware, there may be different time between
+ channel conversion and sample update. 'Integration time' is used to
+ specify the channel internal conversion time. And sample update
+ interval is equal to average sample count multiple integration time.
+ Unit as microsecond.
--
2.7.4
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