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Subject[PATCH v8 05/10] coresight-tpdm: Add integration test support
Date
Integration test for tpdm can help to generate the data for
verification of the topology during TPDM software bring up.

Sample:
echo 1 > /sys/bus/coresight/devices/tmc_etf0/enable_sink
echo 1 > /sys/bus/coresight/devices/tpdm0/enable_source
echo 1 > /sys/bus/coresight/devices/tpdm0/integration_test
echo 2 > /sys/bus/coresight/devices/tpdm0/integration_test
cat /dev/tmc_etf0 > /data/etf-tpdm0.bin

Signed-off-by: Tao Zhang <quic_taozha@quicinc.com>
Signed-off-by: Mao Jinlong <quic_jinlmao@quicinc.com>
---
drivers/hwtracing/coresight/coresight-tpdm.c | 54 ++++++++++++++++++++
drivers/hwtracing/coresight/coresight-tpdm.h | 14 +++++
2 files changed, 68 insertions(+)

diff --git a/drivers/hwtracing/coresight/coresight-tpdm.c b/drivers/hwtracing/coresight/coresight-tpdm.c
index fac7b9d92af8..7c55f0c023d1 100644
--- a/drivers/hwtracing/coresight/coresight-tpdm.c
+++ b/drivers/hwtracing/coresight/coresight-tpdm.c
@@ -121,6 +121,59 @@ static void tpdm_init_default_data(struct tpdm_drvdata *drvdata)
CS_LOCK(drvdata->base);
}

+/*
+ * value 1: 64 bits test data
+ * value 2: 32 bits test data
+ */
+static ssize_t integration_test_store(struct device *dev,
+ struct device_attribute *attr,
+ const char *buf,
+ size_t size)
+{
+ int i, ret = 0;
+ unsigned long val;
+ struct tpdm_drvdata *drvdata = dev_get_drvdata(dev->parent);
+
+ ret = kstrtoul(buf, 10, &val);
+ if (ret)
+ return ret;
+
+ if (val != 1 && val != 2)
+ return -EINVAL;
+
+ if (!drvdata->enable)
+ return -EINVAL;
+
+ if (val == 1)
+ val = ATBCNTRL_VAL_64;
+ else
+ val = ATBCNTRL_VAL_32;
+ CS_UNLOCK(drvdata->base);
+ writel_relaxed(0x1, drvdata->base + TPDM_ITCNTRL);
+
+ for (i = 0; i < INTEGRATION_TEST_CYCLE; i++)
+ writel_relaxed(val, drvdata->base + TPDM_ITATBCNTRL);
+
+ writel_relaxed(0, drvdata->base + TPDM_ITCNTRL);
+ CS_LOCK(drvdata->base);
+ return size;
+}
+static DEVICE_ATTR_WO(integration_test);
+
+static struct attribute *tpdm_attrs[] = {
+ &dev_attr_integration_test.attr,
+ NULL,
+};
+
+static struct attribute_group tpdm_attr_grp = {
+ .attrs = tpdm_attrs,
+};
+
+static const struct attribute_group *tpdm_attr_grps[] = {
+ &tpdm_attr_grp,
+ NULL,
+};
+
static int tpdm_probe(struct amba_device *adev, const struct amba_id *id)
{
void __iomem *base;
@@ -157,6 +210,7 @@ static int tpdm_probe(struct amba_device *adev, const struct amba_id *id)
desc.pdata = adev->dev.platform_data;
desc.dev = &adev->dev;
desc.access = CSDEV_ACCESS_IOMEM(base);
+ desc.groups = tpdm_attr_grps;
drvdata->csdev = coresight_register(&desc);
if (IS_ERR(drvdata->csdev))
return PTR_ERR(drvdata->csdev);
diff --git a/drivers/hwtracing/coresight/coresight-tpdm.h b/drivers/hwtracing/coresight/coresight-tpdm.h
index c8a101cbb4c7..d808fa1e8d4a 100644
--- a/drivers/hwtracing/coresight/coresight-tpdm.h
+++ b/drivers/hwtracing/coresight/coresight-tpdm.h
@@ -14,6 +14,20 @@
/* Enable bit for DSB subunit */
#define TPDM_DSB_CR_ENA BIT(0)

+/* TPDM integration test registers */
+#define TPDM_ITATBCNTRL (0xEF0)
+#define TPDM_ITCNTRL (0xF00)
+
+/* Register value for integration test */
+#define ATBCNTRL_VAL_32 0xC00F1409
+#define ATBCNTRL_VAL_64 0xC01F1409
+
+/*
+ * Number of cycles to write value when
+ * integration test.
+ */
+#define INTEGRATION_TEST_CYCLE 10
+
/**
* The bits of PERIPHIDR0 register.
* The fields [6:0] of PERIPHIDR0 are used to determine what
--
2.17.1
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