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Subject[PATCH 5.4 122/255] iio: ABI: Fix wrong format of differential capacitance channel ABI.
Date
From: Jonathan Cameron <Jonathan.Cameron@huawei.com>

[ Upstream commit 1efc41035f1841acf0af2bab153158e27ce94f10 ]

in_ only occurs once in these attributes.

Fixes: 0baf29d658c7 ("staging:iio:documentation Add abi docs for capacitance adcs.")
Signed-off-by: Jonathan Cameron <Jonathan.Cameron@huawei.com>
Reviewed-by: Andy Shevchenko <andy.shevchenko@gmail.com>
Link: https://lore.kernel.org/r/20220626122938.582107-3-jic23@kernel.org
Signed-off-by: Sasha Levin <sashal@kernel.org>
---
Documentation/ABI/testing/sysfs-bus-iio | 2 +-
1 file changed, 1 insertion(+), 1 deletion(-)

diff --git a/Documentation/ABI/testing/sysfs-bus-iio b/Documentation/ABI/testing/sysfs-bus-iio
index c3767d4d01a6..4d873e813949 100644
--- a/Documentation/ABI/testing/sysfs-bus-iio
+++ b/Documentation/ABI/testing/sysfs-bus-iio
@@ -138,7 +138,7 @@ Description:
Raw capacitance measurement from channel Y. Units after
application of scale and offset are nanofarads.

-What: /sys/.../iio:deviceX/in_capacitanceY-in_capacitanceZ_raw
+What: /sys/.../iio:deviceX/in_capacitanceY-capacitanceZ_raw
KernelVersion: 3.2
Contact: linux-iio@vger.kernel.org
Description:
--
2.35.1


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