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    Subject[PATCH 5.10 190/390] iio: ABI: Fix wrong format of differential capacitance channel ABI.
    Date
    From: Jonathan Cameron <Jonathan.Cameron@huawei.com>

    [ Upstream commit 1efc41035f1841acf0af2bab153158e27ce94f10 ]

    in_ only occurs once in these attributes.

    Fixes: 0baf29d658c7 ("staging:iio:documentation Add abi docs for capacitance adcs.")
    Signed-off-by: Jonathan Cameron <Jonathan.Cameron@huawei.com>
    Reviewed-by: Andy Shevchenko <andy.shevchenko@gmail.com>
    Link: https://lore.kernel.org/r/20220626122938.582107-3-jic23@kernel.org
    Signed-off-by: Sasha Levin <sashal@kernel.org>
    ---
    Documentation/ABI/testing/sysfs-bus-iio | 2 +-
    1 file changed, 1 insertion(+), 1 deletion(-)

    diff --git a/Documentation/ABI/testing/sysfs-bus-iio b/Documentation/ABI/testing/sysfs-bus-iio
    index df42bed09f25..53f07fc41b96 100644
    --- a/Documentation/ABI/testing/sysfs-bus-iio
    +++ b/Documentation/ABI/testing/sysfs-bus-iio
    @@ -142,7 +142,7 @@ Description:
    Raw capacitance measurement from channel Y. Units after
    application of scale and offset are nanofarads.

    -What: /sys/.../iio:deviceX/in_capacitanceY-in_capacitanceZ_raw
    +What: /sys/.../iio:deviceX/in_capacitanceY-capacitanceZ_raw
    KernelVersion: 3.2
    Contact: linux-iio@vger.kernel.org
    Description:
    --
    2.35.1


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