Messages in this thread | | | Subject | Re: [PATCH v1 1/1] lib/test_scanf: Handle n_bits == 0 in random tests | From | Richard Fitzgerald <> | Date | Tue, 27 Jul 2021 16:27:37 +0100 |
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On 27/07/2021 16:01, Andy Shevchenko wrote: > UBSAN reported (via LKP) > > [ 11.021349][ T1] UBSAN: shift-out-of-bounds in lib/test_scanf.c:275:51 > [ 11.022782][ T1] shift exponent 32 is too large for 32-bit type 'unsigned int' > > When n_bits == 0, the shift is out of range. Switch code to use GENMASK > to handle this case. > > Fixes: 50f530e176ea ("lib: test_scanf: Add tests for sscanf number conversion") > Reported-by: kernel test robot <oliver.sang@intel.com> > Signed-off-by: Andy Shevchenko <andriy.shevchenko@linux.intel.com> > ---
Reviewed-by: Richard Fitzgerald <rf@opensource.cirrus.com>
Sorry about that. Would have been sensible to use GENMASK anyway.
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