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SubjectRe: [PATCH v1 1/1] lib/test_scanf: Handle n_bits == 0 in random tests
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On 27/07/2021 16:01, Andy Shevchenko wrote:
> UBSAN reported (via LKP)
>
> [ 11.021349][ T1] UBSAN: shift-out-of-bounds in lib/test_scanf.c:275:51
> [ 11.022782][ T1] shift exponent 32 is too large for 32-bit type 'unsigned int'
>
> When n_bits == 0, the shift is out of range. Switch code to use GENMASK
> to handle this case.
>
> Fixes: 50f530e176ea ("lib: test_scanf: Add tests for sscanf number conversion")
> Reported-by: kernel test robot <oliver.sang@intel.com>
> Signed-off-by: Andy Shevchenko <andriy.shevchenko@linux.intel.com>
> ---

Reviewed-by: Richard Fitzgerald <rf@opensource.cirrus.com>

Sorry about that. Would have been sensible to use GENMASK anyway.

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