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SubjectRe: [PATCH V1 2/3] pinctrl: qcom: spmi-gpio: Add dtest route for digital input
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On 7/13/2017 5:24 AM, Bjorn Andersson wrote:
> On Mon 12 Jun 23:16 PDT 2017, fenglinw@codeaurora.org wrote:
>
>> From: Fenglin Wu <fenglinw@codeaurora.org>
>>
>> Add property "qcom,dtest-buffer" to specify which dtest rail to feed
>> when the pin is configured as a digital input.
>>
>> Signed-off-by: Fenglin Wu <fenglinw@codeaurora.org>
>> ---
>> .../devicetree/bindings/pinctrl/qcom,pmic-gpio.txt | 15 ++++++++
>> drivers/pinctrl/qcom/pinctrl-spmi-gpio.c | 45 ++++++++++++++++++++++
>> include/dt-bindings/pinctrl/qcom,pmic-gpio.h | 6 +++
>> 3 files changed, 66 insertions(+)
>>
>> diff --git a/Documentation/devicetree/bindings/pinctrl/qcom,pmic-gpio.txt b/Documentation/devicetree/bindings/pinctrl/qcom,pmic-gpio.txt
>> index 1493c0a..521c783 100644
>> --- a/Documentation/devicetree/bindings/pinctrl/qcom,pmic-gpio.txt
>> +++ b/Documentation/devicetree/bindings/pinctrl/qcom,pmic-gpio.txt
>> @@ -195,6 +195,21 @@ to specify in a pin configuration subnode:
>> Valid values are 0-3 corresponding to PMIC_GPIO_AOUT_ATESTx
>> defined in <dt-bindings/pinctrl/qcom,pmic-gpio.h>.
>>
>> +- qcom,dtest-buffer:
>> + Usage: optional
>> + Value type: <u32>
>> + Definition: Selects DTEST rail to route to GPIO when it's configured
>> + as a digital input.
>> + For LV/MV GPIO subtypes, the valid values are 0-3
>> + corresponding to PMIC_GPIO_DIN_DTESTx defined in
>> + <dt-bindings/pinctrl/qcom,pmic-gpio.h>. Only one
>> + DTEST rail can be selected at a time.
>
> As with the analog lines, this is a natural number and I think we should
> encode it as such in the DeviceTree.
>
>> + For 4CH/8CH GPIO subtypes, supported values are 1-15.
>> + 4 DTEST rails are supported in total and more than 1 DTEST
>> + rail can be selected simultaneously. Each bit of the
>> + 4 LSBs represent one DTEST rail, such as [3:0] = 0101
>> + means both DTEST1 and DTEST3 are selected.
>
> I'm not too keen on encoding this as a bitmask. I would much rather
> encode it as multiple values - although that complicates the
> implementation.
>
> Or can we just ignore it? (Is the lack of support in the newer chips a
> result of no-one using this?)

I am not quite sure if any real cases would route multiple DTEST line to
single GPIO, but the register mapping uses the bit mask for 4CH/8CH
subtypes and I think we should support it accordingly. Even if I drop
the support, we still have the difference of the register mapping on the
dtest selection between MV/LV subtypes and legacy 4CH/8CH subtypes,
which means we need a place to unify the dtest definition. I put the
complication here in dtsi which the end user would choose the right
value according to the hardware. I am also fine with putting the
complication in C code, but that would drop the supporting of multiple
DTEST lines selection for 4CH/8CH subtype.

>
>> +
>> Example:
>>
>> pm8921_gpio: gpio@150 {
>> diff --git a/drivers/pinctrl/qcom/pinctrl-spmi-gpio.c b/drivers/pinctrl/qcom/pinctrl-spmi-gpio.c
> [..]
>> @@ -512,6 +526,13 @@ static int pmic_gpio_config_set(struct pinctrl_dev *pctldev, unsigned int pin,
>> return -EINVAL;
>> pad->atest = arg;
>> break;
>> + case PMIC_GPIO_CONF_DTEST_BUFFER:
>> + if ((pad->lv_mv_type && arg > PMIC_GPIO_DIN_DTEST4)
>> + || (!pad->lv_mv_type && arg >
>> + PMIC_GPIO_DIG_IN_DTEST_SEL_MASK))
>> + return -EINVAL;
>> + pad->dtest_buffer = arg;
>> + break;
>> default:
>> return -EINVAL;
>> }
>> @@ -544,6 +565,17 @@ static int pmic_gpio_config_set(struct pinctrl_dev *pctldev, unsigned int pin,
>> val = PMIC_GPIO_MODE_DIGITAL_OUTPUT;
>> }
>>
>
> Remember that you're supposed to be able to have two different states
> defines, one with dtest-buffer and one without - and switching between
> them should enable _and_ disable the dtest buffer.
>
> So you need to detect the absence of qcom,dtest-buffer and you need to
> write the register in this case as well. So before looping over all the
> config parameters, set pad->dtest_buffer to "disabled" and when you get
> here it will either be disabled or have the specified value.
>

>> + if (pad->dtest_buffer != INT_MAX) {
>> + val = pad->dtest_buffer;
>> + if (pad->lv_mv_type)
>> + val |= PMIC_GPIO_LV_MV_DIG_IN_DTEST_EN;
>> +
>
> Instead of representing "disabled" as INT_MAX, you could keep track of
> it in the same representation as the hardware, i.e. 0 would be disabled.
>
> The additional effort would be in the lv_mv case that you need to mask
> in PMIC_GPIO_LV_MV_DIG_IN_DTEST_EN in the few places where you actually
> enable dtest buffering.
>

Thanks for your suggestion, I got the issue here.
PMIC_GPIO_LV_MV_DIG_IN_DTEST_EN need to be unmasked in the case of dtest
disabling.
If we decided to drop the multiple dtest line selection (actually I am
fine with it) and unify the dtest lines values to 1~4 from dtsi, I am Ok
with the suggestion of using 0 to represent "disabled".

>> + ret = pmic_gpio_write(state, pad,
>> + PMIC_GPIO_REG_DIG_IN_CTL, val);
>> + if (ret < 0)
>> + return ret;
>> + }
>> +
> [..]
>> diff --git a/include/dt-bindings/pinctrl/qcom,pmic-gpio.h b/include/dt-bindings/pinctrl/qcom,pmic-gpio.h
>> index 85d8809..21738ed 100644
>> --- a/include/dt-bindings/pinctrl/qcom,pmic-gpio.h
>> +++ b/include/dt-bindings/pinctrl/qcom,pmic-gpio.h
>> @@ -99,6 +99,12 @@
>> #define PMIC_GPIO_AOUT_ATEST3 2
>> #define PMIC_GPIO_AOUT_ATEST4 3
>>
>> +/* DTEST buffer for digital input mode */
>> +#define PMIC_GPIO_DIN_DTEST1 0
>> +#define PMIC_GPIO_DIN_DTEST2 1
>> +#define PMIC_GPIO_DIN_DTEST3 2
>> +#define PMIC_GPIO_DIN_DTEST4 3
>> +
>
> Please drop these defines.
>
> Regards,
> Bjorn
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