Messages in this thread | | | Date | Sat, 27 Jun 2015 11:14:40 +0200 | From | Daniel Borkmann <> | Subject | Re: [PATCH net-next] test_bpf: extend tests for 32-bit endianness conversion |
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On 06/26/2015 05:25 PM, Xi Wang wrote: > Currently "ALU_END_FROM_BE 32" and "ALU_END_FROM_LE 32" do not test if > the upper bits of the result are zeros (the arm64 JIT had such bugs). > Extend the two tests to catch this. > > Cc: Alexei Starovoitov <ast@plumgrid.com> > Signed-off-by: Xi Wang <xi.wang@gmail.com>
Thanks for extending the test suite!
Acked-by: Daniel Borkmann <daniel@iogearbox.net>
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