Messages in this thread Patch in this message | | | From | Huang Shijie <> | Subject | [PATCH v2 append] mtd: update the ABI document about the ecc step | Date | Thu, 16 May 2013 12:09:43 +0800 |
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We add a new sys node for ecc step. So update the ABI document about it.
Signed-off-by: Huang Shijie <b32955@freescale.com> --- Documentation/ABI/testing/sysfs-class-mtd | 11 +++++++++++ 1 files changed, 11 insertions(+), 0 deletions(-)
diff --git a/Documentation/ABI/testing/sysfs-class-mtd b/Documentation/ABI/testing/sysfs-class-mtd index 3105644..62a1cda 100644 --- a/Documentation/ABI/testing/sysfs-class-mtd +++ b/Documentation/ABI/testing/sysfs-class-mtd @@ -173,3 +173,14 @@ Description: This is generally applicable only to NAND flash devices with ECC capability. It is ignored on devices lacking ECC capability; i.e., devices for which ecc_strength is zero. + +What: /sys/class/mtd/mtdX/ecc_step +Date: May 2013 +KernelVersion: 3.10 +Contact: linux-mtd@lists.infradead.org +Description: + The size of ecc step which is used for per ecc correction. + See more in the ecc_strength above. This will always be a + non-negative integer. + + In the case of devices lacking any ECC capability, it is 0. -- 1.7.1
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