lkml.org 
[lkml]   [2013]   [Feb]   [18]   [last100]   RSS Feed
Views: [wrap][no wrap]   [headers]  [forward] 
 
Messages in this thread
/
Date
From
SubjectRe: [PATCH] ACPI / scan: Make it clear that acpi_bus_trim() cannot fail
Hi,

On Thu, Jan 24, 2013 at 11:56:50PM +0100, Rafael J. Wysocki wrote:
> From: Rafael J. Wysocki <rafael.j.wysocki@intel.com>
>
> Since acpi_bus_trim() cannot fail, change its definition to a void
> function, so that its callers don't check the return value in vain
> and update the callers.

I have missed a few patchsets/discussions in the last month and wanted to
ask a question related to this: Does the new always-succeed 2-pass
trim_device design guarantee safe memory hot-remove operations?

Afaict if memory offline fails now, the device is ejected (_EJ0) anyways
causing a panic. Tested in a VM with linux-next-20130207 and
linux-next-20130218 by doing an SCI-eject request on a hot-plugged dimm.

Are there more patches in development for safe memory hot-remove?

thanks,

- Vasilis


\
 
 \ /
  Last update: 2013-02-18 14:01    [W:0.109 / U:0.020 seconds]
©2003-2020 Jasper Spaans|hosted at Digital Ocean and TransIP|Read the blog|Advertise on this site